• DocumentCode
    2874464
  • Title

    On the Company We Keep: Combined Scale-and-Scope Externalities in the Growth of IT Industry Co-agglomerations

  • Author

    Kauffman, Robert J. ; Kumar, Ajay

  • Author_Institution
    Arizona State Univ., Tempe
  • fYear
    2008
  • fDate
    7-10 Jan. 2008
  • Firstpage
    412
  • Lastpage
    412
  • Abstract
    Most information technology (IT) industry clusters exhibit the co-agglomeration of several industries. We propose that the synergies between industries do not only consist of separate scale effects and scope effects. They also exhibit combined scale-and-scope effects or externalities, so the scale of one industry affects others´ growth. Our study analyzes the co-agglomeration of four IT industries in 3,142 counties in the United States. Using econometric methods, we find that the co- agglomerated computer manufacturing industry benefits the growth of the semiconductors manufacturing industry. Similarly, collocated firms in the semiconductors manufacturing and computer systems design industries appear to benefit each other. We find little evidence like this for the software publishing industry though. Our study offers policy implications for industrial development planners in the global economy.
  • Keywords
    DP industry; econometrics; semiconductor device manufacture; IT industry co-agglomerations; co- agglomerated computer manufacturing industry; computer systems design industries; econometric methods; scale externality; scope externality; semiconductors manufacturing industry; software publishing industry; Computer aided manufacturing; Computer industry; Computer peripherals; Econometrics; Electronic equipment manufacture; Jacobian matrices; Manufacturing industries; Publishing; Semiconductor device manufacture; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hawaii International Conference on System Sciences, Proceedings of the 41st Annual
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1530-1605
  • Type

    conf

  • DOI
    10.1109/HICSS.2008.332
  • Filename
    4439117