مرکز منطقه ای اطلاع رساني علوم و فناوري - Session 6 testing and design automation [breaker page]

DocumentCode :

2874555

Title :

Session 6 testing and design automation [breaker page]

Author :

Hewlett, F.

Author_Institution :

Texas Instruments Inc., Dallas, TX, USA

Volume :

XXV

fYear :

1982

fDate :

10-12 Feb. 1982

Firstpage :

Lastpage :

Abstract :

Start of the above-titled section of the conference proceedings record.

Keywords :

Testing and design automation;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International

Conference_Location :

San Francisco, CA, USA

Type :

conf

DOI :

10.1109/ISSCC.1982.1156359

Filename :

1156359

Link To Document :