• DocumentCode
    2874715
  • Title

    Effects of scaling and radiation on BiCMOS switching

  • Author

    Phanse, A.M. ; Yuan, J.S. ; Dai, Y. ; Yeh, C.S. ; Gadepally, B.

  • Author_Institution
    University of Central Florida
  • fYear
    1994
  • fDate
    1994
  • Firstpage
    40059
  • Lastpage
    41520
  • Keywords
    BiCMOS integrated circuits; CMOS technology; Delay effects; Equations; Integrated circuit technology; MOSFET circuits; Radiation effects; Switching circuits; Transient response; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
  • Type

    conf

  • DOI
    10.1109/EDMS.1994.771279
  • Filename
    771279
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2874715