Title :
Effects of scaling and radiation on BiCMOS switching
Author :
Phanse, A.M. ; Yuan, J.S. ; Dai, Y. ; Yeh, C.S. ; Gadepally, B.
Author_Institution :
University of Central Florida
Keywords :
BiCMOS integrated circuits; CMOS technology; Delay effects; Equations; Integrated circuit technology; MOSFET circuits; Radiation effects; Switching circuits; Transient response; Voltage;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.771279
