• DocumentCode
    2874810
  • Title

    CIRCUIT PACK BIST FROM SYSTEM TO FACTORY - THE MCERT CHIP

  • Author

    Raghavachari, Partha

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    641
  • Keywords
    Built-in self-test; Circuit testing; Error correction; Hardware; Printed circuits; Production facilities; Random access memory; Read-write memory; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519728
  • Filename
    519728
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2874810