DocumentCode :
2874810
Title :
CIRCUIT PACK BIST FROM SYSTEM TO FACTORY - THE MCERT CHIP
Author :
Raghavachari, Partha
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
641
Keywords :
Built-in self-test; Circuit testing; Error correction; Hardware; Printed circuits; Production facilities; Random access memory; Read-write memory; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519728
Filename :
519728
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2874810
