Title :
Achieving Board-Level BIST Using the Boundary-Scan Master
Author :
Jarwala, Najmi ; Yau, Chi W.
Keywords :
Access protocols; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Hardware; Logic testing; Packaging; System testing; Throughput;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519729
