Title :
Packaging technology for microwave ICs and high speed logic
Author_Institution :
Hewlett-Packard Co., San Jose, CA, USA
Abstract :
The problems of packaging for high-speed logic and microwave ICs have much in common. The issues of circuit partitioning, propagation delay, circuit density, power dissipation, testing and service are as appropriate to microwaves as to high performance computers . . . The number of technical approaches to these problems has grown with the evolution of semiconductor and packaging technologies . . . This panel will review the latest developments in the field from a variety of industries and seek common ground among these. Focus will be on realizable systems of today, plus a view to emerging technology.
Keywords :
Circuit testing; Costs; Electromagnetic heating; Frequency; Integrated circuit packaging; Logic devices; Logic testing; Microwave devices; Microwave technology; Semiconductor device packaging;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1982.1156381