• DocumentCode
    2875051
  • Title

    Test/characterization procedures for high density silicon RAMs

  • Author

    Gangatirkar, P. ; Presson, R. ; Rosner, L.

  • Author_Institution
    IBM Corp., Essex Junction, VT, USA
  • Volume
    XXV
  • fYear
    1982
  • fDate
    10-12 Feb. 1982
  • Firstpage
    62
  • Lastpage
    63
  • Abstract
    Diagnostic procedures which identify and quantify circuit marginalities and process sensitivities of DRAMs will be discussed. The use of fail counts, bit fail maps and parametric data in the development of the 32, 36 and 64Kb RAMs will be described.
  • Keywords
    Aluminum; Circuit testing; Computer aided software engineering; Failure analysis; Pattern analysis; Pattern recognition; Random access memory; Research and development; Silicon; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1982.1156387
  • Filename
    1156387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2875051