DocumentCode
2875221
Title
Welcome
Author
Parry, John
fYear
2005
fDate
15-17 March 2005
Abstract
Presents the welcome message from the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-8985-9
Type
conf
DOI
10.1109/STHERM.2005.1412144
Filename
1412144
Link To Document