مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2875221

Title :

Welcome

Author :

Parry, John

fYear :

2005

fDate :

15-17 March 2005

Abstract :

Presents the welcome message from the conference proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE

Conference_Location :

San Jose, CA, USA

ISSN :

1065-2221

Print_ISBN :

0-7803-8985-9

Type :

conf

DOI :

10.1109/STHERM.2005.1412144

Filename :

1412144

Link To Document :