DocumentCode :
2875300
Title :
FAULT MODELING AND TESTING OF GaAs STATIC RANDOM ACCESS MEMORIES
Author :
Mohan, S. ; Mazumder, P.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
665
Keywords :
Circuit faults; Circuit testing; Cryogenics; Failure analysis; Fault diagnosis; Gallium arsenide; Process design; Random access memory; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519731
Filename :
519731
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2875300
