DocumentCode
2875335
Title
A world of opportunities
fYear
2005
fDate
15-17 March 2005
Abstract
Advertisement.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-8985-9
Type
conf
DOI
10.1109/STHERM.2005.1412150
Filename
1412150
Link To Document