DocumentCode :
2875335
Title :
A world of opportunities
fYear :
2005
fDate :
15-17 March 2005
Abstract :
Advertisement.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
Conference_Location :
San Jose, CA, USA
ISSN :
1065-2221
Print_ISBN :
0-7803-8985-9
Type :
conf
DOI :
10.1109/STHERM.2005.1412150
Filename :
1412150
Link To Document :
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