Title :
A 128K EPROM with redundancy
Author :
Spaw, W. ; Folmsbee, A. ; Canepa, G.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
A 128K EPROM, which utilizes polysilicon fuses to select up to four rows of redundant elements, will be described. The device, with typical access time less than 200ns, features fully static operation and 21V single pulse programming.
Keywords :
CADCAM; Circuit testing; Computer aided manufacturing; Decoding; EPROM; Fuses; Pins; Random access memory; Software testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1982.1156400
