DocumentCode
2875439
Title
Hierarchically nested channels for fast squeezing interfaces with reduced thermal resistance [IC cooling applications]
Author
Brunschwiler, T. ; Kloter, U. ; Linderman, R. ; Rothuizen, H. ; Michel, B.
Author_Institution
IBM Zurich Res. Lab., Ruschlikon, Switzerland
fYear
2005
fDate
15-17 March 2005
Firstpage
31
Lastpage
38
Abstract
We report a simple method to improve bondline formation kinetics by means of a hierarchical set of channels patterned into one of the surfaces. These channel arrays are used to improve the gap squeezing and cooling of single and multiple flip chip electronic modules with highly viscous fluids and thermal pastes. They allow a fast formation of thin gaps or bond lines by reducing the pressure gradient in the thermal interface material as it moves in and out of the gap. Models describing the dynamics of Newtonian fluids in these "hierarchically nested channel" (HNC) interfaces combine squeeze flow and Hagen-Poiseuille theories. Rapid bond line formation is demonstrated for Newtonian fluids and selected particle-filled pastes. Modeling of particle-laden polymeric pastes includes Bingham and Hershel-Bulkley fluid properties. Bond line formation and thermal resistance is improved particularly for high viscosity-high thermal conductivity interface materials created from higher volumetric particle loadings or for thermal interface materials with smaller filler particle diameters.
Keywords
Poiseuille flow; adhesive bonding; cooling; filled polymers; fluid dynamics; heat sinks; integrated circuit packaging; thermal resistance; Bingham fluid properties; Hagen-Poiseuille flow; Hershel-Bulkley fluid properties; IC cooling; Newtonian fluids; bondline formation kinetics; fast gap squeezing interfaces; filler particle diameter; fluid dynamics; heat sink; hierarchically nested channels; high thermal conductivity interface materials; multiple flip chip electronic modules; particle-filled polymeric pastes; rapid bond line formation; squeeze flow; surface patterned channel arrays; thermal interface material pressure gradient; thermal pastes; thermal resistance reduction; viscous fluids; volumetric particle loading; Application specific integrated circuits; Bonding; Conducting materials; Electronics cooling; Flip chip; Kinetic theory; Surface resistance; Thermal conductivity; Thermal loading; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-8985-9
Type
conf
DOI
10.1109/STHERM.2005.1412156
Filename
1412156
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