• DocumentCode
    2875461
  • Title

    Investigations on ride-through capabilities of ASD´s during three-phase unsymmetrical faults

  • Author

    Deswal, S.S. ; Dahiya, Ratna ; Jain, D.K.

  • Author_Institution
    Maharaja Agrasen Inst. of Technol., Delhi, India
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    1915
  • Lastpage
    1921
  • Abstract
    Sensitivity of adjustable speed drives (ASD´s) to voltage sags is a subject of various studies and experimental researches. The main criteria for determining the threshold sensitivity is the input voltage value that causes the disconnection/tripping of frequency converter. It is a known fact that the voltage sags, especially unsymmetrical, can cause ASD´s performance degradation, primarily reduction of available motor torque and the occurrence of significant DC-Link voltage ripple. The objective of this paper is to investigate the performance of an ASD´s under unsymmetrical fault. Only the single line to ground fault has been considered. The performance of the proposed topology is identical for the remaining types of unsymmetrical faults. The application of capacitor bank, battery bank or supercapacitors bank with boost converter to inject energy at DC-Link under unsymmetrical fault i.e. unbalanced voltage sag as ride-through alternative is given in this paper. The observations are made on the basis of simulation and experimental work.
  • Keywords
    fault diagnosis; frequency convertors; power convertors; power supply quality; variable speed drives; DC-Link voltage ripple; adjustable speed drives; battery bank; boost converter; capacitor bank; frequency converter; ground fault; input voltage value; line fault; motor torque; ride-through capabilities; supercapacitors bank; three-phase unsymmetrical faults; threshold sensitivity; voltage sags; Batteries; Capacitors; Circuit faults; Power quality; Rectifiers; Variable speed drives; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Melbourne, VIC
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-61284-969-0
  • Type

    conf

  • DOI
    10.1109/IECON.2011.6119599
  • Filename
    6119599