DocumentCode :
2875547
Title :
Reliability testing of silicone-based thermal greases [IC cooling applications]
Author :
Gowda, Arun ; Esler, David ; Paisner, Sara N. ; Tonapi, Sandeep ; Nagarkar, Kaustubh ; Srihari, K.
Author_Institution :
GE Global Res. Center, Niskayuna, NY, USA
fYear :
2005
fDate :
15-17 March 2005
Firstpage :
64
Lastpage :
71
Abstract :
Thermal interface materials (TIMs) play a key role in the thermal management of microelectronics by providing a path of low thermal impedance between the heat generating devices and the heat dissipating components (heat spreader/sink). Thermal greases are TIM solutions that are widely utilized in the industry for the cooling of microelectronics. Thermal greases are expected to provide a very low thermal resistance path due to their ability to penetrate into the surface features of heat spreaders/sinks and silicon die. In addition, thermal greases do not require post-processing. However, some of the disadvantages associated with thermal greases are their tendency to "dry-out" and "pump-out" during prolonged periods of operation. These phenomena can drastically reduce the heat dissipation capability of the thermal grease layer. A "perfect" high thermal conductivity and low contact resistance TIM layer may become a voided and cracked layer on exposure to thermal and mechanical stresses. In this research, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.
Keywords :
cooling; filled polymers; greases; heat sinks; integrated circuit packaging; integrated circuit reliability; life testing; thermal management (packaging); thermal resistance; IC cooling; accelerated reliability testing; grease dry-out; grease pump-out; heat dissipation; heat sinks; heat spreaders; low contact resistance TIM layer; low thermal impedance; low thermal resistance; mechanical stresses; microelectronics thermal management; silicone-based thermal greases; thermal grease reliability testing; thermal interface materials; thermal stresses; Application specific integrated circuits; Cooling; Heat sinks; Integrated circuit testing; Microelectronics; Surface resistance; Thermal conductivity; Thermal management; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8985-9
Type :
conf
DOI :
10.1109/STHERM.2005.1412160
Filename :
1412160
Link To Document :
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