Title :
Multirate ASR models for phone-class dependent N-best list rescoring
Author :
Gadde, Venkata R. ; Sönmez, Kemal ; Franco, Horacio
Author_Institution :
Speech Technol. & Res. Lab., SRI Int., Menlo Park, CA
Abstract :
Speech comprises a variety of acoustical phenomena occurring at differing rates. Fixed-rate ASR systems assume in effect a constant temporal rate of information flow via incorporating uniform statistics in proportion to a sound´s duration. The usual tradeoff window length of 25-30 milliseconds represents a time-frequency resolution compromise, which aims to allow reasonable speed for following changes in the spectral trajectories and sufficient number of samples to estimate the harmonic structure. In this work, we describe a technique to augment a recognizer that uses this compromise with information from multiple-rate spectral models that emphasize either better time or better frequency resolution in order to improve performance. The main idea is to use the hypotheses generated by a fixed-rate recognizer to determine the appropriate model rate for a segment of the speech waveform. This is realized through a technique based on rescoring of N-best lists with acoustical models using different temporal windows by a phone-dependent posterior-like score. We report results on the NIST Evaluation 2002 dataset, and demonstrate that the rescoring method produces word error rate (WER) improvements in a baseline system
Keywords :
hidden Markov models; spectral analysis; speech processing; speech recognition; N-best list rescoring; automatic speech recognition; fixed-rate recognizer; hidden Markov model; multiple-rate spectral model; multirate ASR models; phone-class dependent; speech waveform; word error rate; Automatic speech recognition; Error analysis; Hidden Markov models; Laboratories; NIST; Signal generators; Spectrogram; Speech recognition; Statistics; Time frequency analysis;
Conference_Titel :
Automatic Speech Recognition and Understanding, 2005 IEEE Workshop on
Conference_Location :
San Juan
Print_ISBN :
0-7803-9478-X
Electronic_ISBN :
0-7803-9479-8
DOI :
10.1109/ASRU.2005.1566513