Title :
Locating Bridging Faults in Memory Arrays
Author :
van de Goor, A.J. ; van der Arend, P.C.M. ; Tromp, G.J.
Keywords :
Algorithm design and analysis; Circuit faults; Computer architecture; Decoding; Fault location; Integrated circuit interconnections; Performance evaluation; Random access memory; Read-write memory; Testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519733
