Title :
P-Store: Genuine Partial Replication in Wide Area Networks
Author :
Schiper, Nicolas ; Sutra, Pierre ; Pedone, Fernando
Author_Institution :
Univ. of Lugano, Lugano, Switzerland
fDate :
Oct. 31 2010-Nov. 3 2010
Abstract :
Partial replication is a way to increase the scalability of replicated systems: updates only need to be applied to a subset of the system´s sites, thus allowing replicas to handle independent parts of the workload in parallel. In this paper, we propose P-Store, a partially replicated key-value store for wide area networks. In P-Store, each transaction T optimistically executes on one or more sites and is then certified to guarantee serializability of the execution. The certification protocol is genuine, it only involves sites that replicate data items read or written by T, and incorporates a mechanism to minimize a convoy effect. P-Store makes a thrifty use of an atomic multicast service to guarantee correctness: no messages need to be multicast during T´s execution and a single message is multicast to certify T. In case T is global, that is, T´s execution is distributed at different geographical locations, an extra vote phase is required. Our approach may offer better scalability than previously proposed solutions that either require multiple atomic multicast messages to execute T or are non-genuine. Experimental evaluations reveal that the convoy effect plays an important role even when one percent of the transactions are global. We also compare the scalability of our approach to a fully replicated solution when the proportion of global transactions and the number of sites vary.
Keywords :
wide area networks; P-Store; certification protocol; genuine partial replication; geographical locations; key value store; multicast messages; replicated systems; wide area networks; Computer crashes; Databases; Delay; History; Protocols; Scalability; Wide area networks; Fault-tolerance; partial database replication; serializability; wide area networks;
Conference_Titel :
Reliable Distributed Systems, 2010 29th IEEE Symposium on
Conference_Location :
New Delhi
Print_ISBN :
978-0-7695-4250-8
DOI :
10.1109/SRDS.2010.32