• DocumentCode
    2875782
  • Title

    Practical versus theoretical limits of VLSI

  • Author

    Berglund, C. ; Jaeger, Richard C.

  • Author_Institution
    Intel Corp., Aloha, OR, USA
  • Volume
    XXVI
  • fYear
    1983
  • fDate
    23-25 Feb. 1983
  • Firstpage
    212
  • Lastpage
    213
  • Abstract
    Historically, predictions of limits to VLSI technology have been based on fundamental and theoretical laws of physics. In recent years, it has become evident that the major limitations to VLSI technology advancement are more practical in nature. These include tradeoffs between reliability and scaling, complexity, available tools and equipment, voltage standards, and magnitude of capital investment, as well as fundamental, material, device and circuit limits. . . Panelists will address these issues as they apply to VLSI evolution over the next five to ten years, and attempt to define the key bottlenecks in reaching theoretical limits.
  • Keywords
    Circuits; Costs; Engineering management; Lithography; MOSFETs; Research and development management; Silicon; Steel; Technology management; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1983.1156425
  • Filename
    1156425