DocumentCode
2875782
Title
Practical versus theoretical limits of VLSI
Author
Berglund, C. ; Jaeger, Richard C.
Author_Institution
Intel Corp., Aloha, OR, USA
Volume
XXVI
fYear
1983
fDate
23-25 Feb. 1983
Firstpage
212
Lastpage
213
Abstract
Historically, predictions of limits to VLSI technology have been based on fundamental and theoretical laws of physics. In recent years, it has become evident that the major limitations to VLSI technology advancement are more practical in nature. These include tradeoffs between reliability and scaling, complexity, available tools and equipment, voltage standards, and magnitude of capital investment, as well as fundamental, material, device and circuit limits. . . Panelists will address these issues as they apply to VLSI evolution over the next five to ten years, and attempt to define the key bottlenecks in reaching theoretical limits.
Keywords
Circuits; Costs; Engineering management; Lithography; MOSFETs; Research and development management; Silicon; Steel; Technology management; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1983.1156425
Filename
1156425
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