Title :
A comparison between voltage waveforms to enhance the lifetime of MEMS switch
Author :
Lai, C.H. ; Wong, Wallace S H
Author_Institution :
Sch. of Eng., Comput. & Sci., Swinbu rne Univ. of Technol. (Sarawak Campus), Malaysia
Abstract :
Dielectric charging and mechanical bouncing are two vital lifetime limiting factors of RF MEMS switches. Among the numerous approaches to improve the reliability of RF MEMS switch, tailoring the applied actuation voltage waveform is an approach that does not require physical changes to the MEMS switch design. This paper compares the performance of different actuation voltage waveforms in terms of their capability of reducing dielectric charging and contact bouncing, sensitivity to MEMS switch variations, the resulting switching speed and the complexity in their implementation.
Keywords :
microswitches; reliability; RF MEMS switch reliability; actuation voltage waveforms; contact bouncing; dielectric charging; lifetime limiting factors; mechanical bouncing; switching speed; Contacts; Dielectrics; Force; Microswitches; Radio frequency; Voltage measurement;
Conference_Titel :
IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-61284-969-0
DOI :
10.1109/IECON.2011.6119629