• DocumentCode
    2876074
  • Title

    TWO-PATTERN TEST CAPABILITIES OF AUTONOMOUS TPG CIRCUITS

  • Author

    FURUYA, KIYOSHI ; McCluskey, Edward J.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    704
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Design for testability; Electronic equipment testing; Logic testing; Sequential circuits; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519735
  • Filename
    519735
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2876074