DocumentCode :
2876247
Title :
Defect Level Estimation of Random and Pseudorandom Testing
Author :
Jone, Wen-Ben
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
712
Keywords :
Circuit faults; Circuit testing; Computer science; Contracts; Equations; Fitting; Manufacturing; Probability; Sequential analysis; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519736
Filename :
519736
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2876247
