DocumentCode
2876247
Title
Defect Level Estimation of Random and Pseudorandom Testing
Author
Jone, Wen-Ben
fYear
1991
fDate
26-30 Oct 1991
Firstpage
712
Keywords
Circuit faults; Circuit testing; Computer science; Contracts; Equations; Fitting; Manufacturing; Probability; Sequential analysis; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519736
Filename
519736
Link To Document