DocumentCode :
2876442
Title :
CMOS technology directions
Author :
Rodgers, T.
Author_Institution :
INTJR Corp., Woodside, CA, USA
Volume :
XXVI
fYear :
1983
fDate :
23-25 Feb. 1983
Firstpage :
210
Lastpage :
211
Abstract :
Unlike NMOS technology, which has been relatively standardized by the industry, CMOS technology is currently much more varied in its methods of production. Presently, the following alternatives (and related issues) exist: bulk CMOS versus CMOS-SOS (cost, yield, performance), P-well versus N-well architecture (performance, latch-up, immunity, alpha immunity), epitaxial versus non-epitaxial substrates (latch-up, alphas, cost, yield) and single versus double poly processing (density, cost, performance). In the future, decisions regarding new isolation techniques (e.g., slot), new interconnect layers (e.g., silicides), and methods for soft-error immunity (e.g., buried layers), may cause a further fragmentation of the CMOS technology.
Keywords :
Appropriate technology; CMOS process; CMOS technology; Engineering management; Isolation technology; MOS devices; Research and development management; Silicon on insulator technology; Substrates; Technology management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ISSCC.1983.1156464
Filename :
1156464
Link To Document :
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