DocumentCode :
2876474
Title :
Design, testing and optimization of a micropump for cryogenic spot cooling applications
Author :
Foroughi, Parisa ; Benetis, Vytenis ; Ohadi, Michael ; Zhao, Yuan ; Lawler, John
Author_Institution :
Dept. of Mech. Eng., Maryland Univ., College Park, MD, USA
fYear :
2005
fDate :
15-17 March 2005
Firstpage :
335
Lastpage :
340
Abstract :
The performance of two micropumps with different electrode designs in liquid N2 was investigated in this study. One of the experimental challenges was developing a method for measuring the flow rate of the liquid N2. By combining a numerical model of the non-isothermal flow of the liquid N2 around the loop and the experimental measurements of the temperatures around the flow loop, the liquid N2 flow rates could be determined accurately enough to compare the pumping performance of these micropumps. The first tested micropump had an electrode spacing of 20 μm and an electrode pair spacing of 80 μm, while the second pump had an electrode spacing of 50 μm and electrode-pair spacing of 200 μm. The results showed that both micropumps pumped sufficient liquid N2 to cool a typical superconductive sensor or other low power device. For both pumps, the pumping capacities increased with increasing EHD voltage. The pump with the smaller electrode spacing generated a higher flow rate at a lower applied voltage. This pump generated flow rates as high as 10 mL/min at an applied voltage of 500 V.
Keywords :
cooling; cryopumping; electrohydrodynamics; flow measurement; micropumps; nitrogen; optimisation; 20 micron; 200 micron; 50 micron; 500 V; 80 micron; EHD voltage proportional pumping capacities; N2; cryogenic spot cooling; electrode pair spacing; flow loop temperatures; flow rate measurement; liquid nitrogen; micropump electrode spacing; micropump optimization; nonisothermal flow; superconducting detectors; superconducting sensors; Cooling; Cryogenics; Design optimization; Electrodes; Fluid flow; Fluid flow measurement; Micropumps; Temperature measurement; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8985-9
Type :
conf
DOI :
10.1109/STHERM.2005.1412201
Filename :
1412201
Link To Document :
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