DocumentCode
2876761
Title
Hierarchical Test Generation Based on Delayed Propagation
Author
Karam, M. ; Leveugle, R. ; Saucier, G.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
739
Keywords
Assembly; Automata; Automatic test pattern generation; Circuit faults; Circuit testing; Context modeling; Design automation; Integrated circuit testing; Performance evaluation; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519739
Filename
519739
Link To Document