DocumentCode :
2876761
Title :
Hierarchical Test Generation Based on Delayed Propagation
Author :
Karam, M. ; Leveugle, R. ; Saucier, G.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
739
Keywords :
Assembly; Automata; Automatic test pattern generation; Circuit faults; Circuit testing; Context modeling; Design automation; Integrated circuit testing; Performance evaluation; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519739
Filename :
519739
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2876761
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