DocumentCode
2876864
Title
Classification of microarray datasets using finite impulse response extreme learning machine for cancer diagnosis
Author
Lee, Kevin ; Man, Zhihong ; Wang, Dianhui ; Cao, Zhenwei
Author_Institution
Fac. of Eng. & Ind. Sci., Swinburne Univ. of Technol., Melbourne, VIC, Australia
fYear
2011
fDate
7-10 Nov. 2011
Firstpage
2347
Lastpage
2352
Abstract
Cancer diagnosis is a highly researched field in bioinformatics since the introduction of microarray gene expression technology which allows multiple diseases to be simultaneously tested and compared between healthy and malignant cells. This paper analyses the use of a recently suggested neural network based classifier known as the finite impulse response extreme learning machine (FIR-ELM) for the classification of two binary bioinformatics datasets consisting of microarray gene expressions for leukemia and colon tumor. The FIR-ELM is based on the single hidden layer feedforward neural network (SLFN) whose weights are trained to reduce the effects of noise and improve the robustness of the classifier. The hidden layer of the FIR-ELM is seen to be able to reduce the noise and disturbances from the full microarray dataset which is known to consist of many experimental errors and biases accrued from the production process. Experimental results have shown that the FIR-ELM is capable of achieving good performance compared to conventional classifiers such as the back propagation artificial neural network (BP-ANN), extreme learning machine (ELM), and support vector machine (SVM) which implement a gene selection procedure prior to working on the datasets.
Keywords
bioinformatics; cancer; feedforward neural nets; learning (artificial intelligence); patient diagnosis; pattern classification; FIR-ELM; back propagation artificial neural network; bioinformatics; cancer diagnosis; colon tumor; finite impulse response extreme learning machine; leukemia; microarray datasets; microarray gene expression technology; neural network based classifier; single hidden layer feedforward neural network; Accuracy; Band pass filters; Cancer; Classification algorithms; Colon; Cutoff frequency; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Melbourne, VIC
ISSN
1553-572X
Print_ISBN
978-1-61284-969-0
Type
conf
DOI
10.1109/IECON.2011.6119676
Filename
6119676
Link To Document