DocumentCode :
2876943
Title :
Using Input-to-Output Masking for System-level Vulnerability estimation in high-performance processors
Author :
Haghdoost, Alireza ; Asadi, Hossein ; Baniasadi, Amirali
Author_Institution :
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
fYear :
2010
fDate :
23-24 Sept. 2010
Firstpage :
91
Lastpage :
98
Abstract :
In this paper, we enhance previously suggested vulnerability estimation techniques by presenting a detailed modeling technique based on Input-to-Output Masking (IOM). Moreover we use our model to compute the System-level Vulnerability Factor (SVF) for data-path components in a high-performance processor. As we show, recent suggested estimation techniques overlook the issue of error masking, mainly focusing on time periods in which an error could potentially propagate in the system. In this work we show that this is incomplete as it ignores the masking impact. Our results show that including the IOM factor can significantly affect the system-level vulnerability for data-path components. As a case study, we analyze the IOM factor for CPUs with different configurations. Our results show that the average variation of the IOM factor is less than 5%. Meantime, the IOM factor varies between 24% to 76% for the applications studied here. Accordingly we find the IOM factor to be less configuration dependent and mainly workload dependent.
Keywords :
data integrity; microprocessor chips; IOM; SVF; data path components; detailed modeling technique; error masking; estimation techniques; high performance processors; input-to-output masking; system level vulnerability estimation; system level vulnerability factor; Analytical models; Computational modeling; Equations; Estimation; Mathematical model; Program processors; Reliability; Architectural Vulnerabulity Factor; Fault Masking Factor; High-Performance Processors; System Level-Vulnerability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Architecture and Digital Systems (CADS), 2010 15th CSI International Symposium on
Conference_Location :
Tehran
Print_ISBN :
978-1-4244-6267-4
Type :
conf
DOI :
10.1109/CADS.2010.5623540
Filename :
5623540
Link To Document :
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