• DocumentCode
    2876985
  • Title

    Performance of Silver Nano Particles as an Electronics Packaging Interconnects Material

  • Author

    Joo, Sungchul ; Baldwin, Daniel F.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    219
  • Lastpage
    226
  • Abstract
    Silver nano particle materials are investigated for use in microelectronics packaging as an innovative lead-free interconnect material. The nano particle materials were evaluated in terms of mechanical, electrical, metallurgical, and reliability performance. The silver nano particles are around 8 nm in diameter and are sintered at a temperature of 230 C to form material nearly indistinguishable from the bulk metal. Sintering behaviors are examined to see how the nano particles form grains with different sintering process conditions; resistivity is measured to estimate the electrical performance of the sintered nano particles; adhesion tests are conducted for measuring the adhesion strength of the processed silver nano particle materials with other packaging materials; leakage current measurement is performed to see the silver electro-migration effect; frequency response is measured for RF applications, and thermal shock tests are conducted to evaluate the electronics packages of electronics packages using the silver nano particle interconnect materials.
  • Keywords
    adhesion; electrical resistivity; electromigration; frequency response; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; leakage currents; nanoparticles; silver; sintering; thermal shock; Ag; RF applications; adhesion strength measurement; adhesion tests; electrical reliability; electronics packaging interconnects material; electronics packaging reliability; frequency response; innovative lead-free interconnect material; leakage current measurement; mechanical reliability; metallurgical reliability; microelectronics packaging; resistivity measurement; silver electro-migration effect; silver nano particle interconnect material; sintering behaviors; thermal shock tests; Conducting materials; Current measurement; Electric variables measurement; Electronic equipment testing; Electronic packaging thermal management; Electronics packaging; Frequency measurement; Inorganic materials; Particle measurements; Silver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373801
  • Filename
    4249887