DocumentCode :
2877148
Title :
Surface roughness and polarimetric entropy
Author :
Cloude, Shane R. ; Papathanassiou, Konstantinos P.
Author_Institution :
Appl. Electromagn., St. Andrews, UK
Volume :
5
fYear :
1999
fDate :
1999
Firstpage :
2443
Abstract :
In this paper we relate the eigenvector formulation of polarimetric backscatter to published coherence and amplitude ratio approaches to surface roughness measurement. Several important relationships appear and the formulation leads us to propose a new model for the analysis of surface data which promises to provide separable roughness and moisture parameters
Keywords :
backscatter; eigenvalues and eigenfunctions; electromagnetic wave scattering; entropy; moisture; radar polarimetry; remote sensing by radar; rough surfaces; soil; amplitude ratio; coherence; eigenvector formulation; moisture; polarimetric backscatter; polarimetric entropy; surface roughness; Coherence; Covariance matrix; Eigenvalues and eigenfunctions; Electromagnetic scattering; Entropy; Equations; Moisture; Radar scattering; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
Conference_Location :
Hamburg
Print_ISBN :
0-7803-5207-6
Type :
conf
DOI :
10.1109/IGARSS.1999.771537
Filename :
771537
Link To Document :
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