• DocumentCode
    2877151
  • Title

    Product Line Based Ontology Development for Semantic Web Service

  • Author

    Zhang, Weishan ; Kunz, Thomas

  • Author_Institution
    Sch. of Software Eng., Tongji Univ., Shanghai
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    183
  • Lastpage
    188
  • Abstract
    Ontology is recognized as a key technology for the success of the semantic Web. Building reusable and evolve-able ontologies in order to cope with ontology evolution and requirement changes is increasingly important. But the existing methodologies and tools fail to support effective ontology reuse and evolution. In this paper, we present a product line based reuse-oriented ontology development methodology which integrates ontology development with design by reuse and design for reuse. The basic building block in our approach is the meta-ontology. In the first stage, reengineering of existing ontologies will lead to the initial implementation of the meta-onotologies using design by reuse and with the objective of design for reuse. After that step new ontologies could be generated by reusing these meta-ontologies. We demonstrate our approach with a semantic Web Service application to show how to build reusable meta-ontologies with a generic composite process template and generate processes for different example scenarios
  • Keywords
    Web services; object-oriented programming; ontologies (artificial intelligence); semantic Web; software prototyping; software reusability; systems re-engineering; composite process template; metaontology; ontology evolution; ontology reengineering; ontology requirement; ontology reuse; product line based reuse-oriented ontology development; semantic Web service; Automation; Buildings; Computer architecture; OWL; Ontologies; Road transportation; Semantic Web; Service oriented architecture; Systems engineering and theory; Web services;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service-Oriented System Engineering, 2006. SOSE '06. Second IEEE International Workshop
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7695-2726-4
  • Type

    conf

  • DOI
    10.1109/SOSE.2006.25
  • Filename
    4027136