Title :
HIGH PERFORMANCE PIN ELECTRONICS EMPLOYING GaAs IC AND HYBRID CIRCUIT PACKAGING TECHNOLOGY
Author :
Baril, Barry ; Clayson, Dan ; McCracken, David ; Taylor, Stewart
Keywords :
Bandwidth; Circuit testing; Driver circuits; Electronic equipment testing; Electronic packaging thermal management; Electronics packaging; Gallium arsenide; Hybrid integrated circuits; Integrated circuit packaging; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519743