DocumentCode :
2877202
Title :
DELAY TESTING OF DIGITAL CIRCUITS BY OUTPUT WAVEFORM ANALYSIS
Author :
Franco, Piero ; McCluskey, Edward J.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
798
Keywords :
Circuit faults; Circuit testing; Delay effects; Digital circuits; Electrical fault detection; Fault detection; Logic circuits; Propagation delay; Sampling methods; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519745
Filename :
519745
Link To Document :
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