Title :
DELAY TESTING OF DIGITAL CIRCUITS BY OUTPUT WAVEFORM ANALYSIS
Author :
Franco, Piero ; McCluskey, Edward J.
Keywords :
Circuit faults; Circuit testing; Delay effects; Digital circuits; Electrical fault detection; Fault detection; Logic circuits; Propagation delay; Sampling methods; Timing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519745
