Title :
FAST SIGNATURE COMPUTATION FOR LINEAR COMPACTORS
Author :
Lambidonis, D. ; Ivanov, A. ; Agarwal, V.K.
Keywords :
Application software; Built-in self-test; Central Processing Unit; Circuit faults; Circuit simulation; Compaction; Computational modeling; Laboratories; Testing; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519746