Title :
REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING
Author :
Saxena, Nirmal R. ; Franco, Piero ; McCluskey, Edward J.
Keywords :
Automata; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Laboratories; Pattern analysis; Polynomials; Probability; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519747
