Terahertz time-resolved reflection spectroscopy for electrical conductivity measurements in the femtosecond laser-induced ablation dynamics

Author

Kim, K.Y. ; Glownia, J.H. ; Taylor, A.J. ; Rodriguez, G.

Author_Institution

Center for Integrated Nanotechnol., Los Alamos Nat. Lab., Los Alamos, NM

fYear

2006

fDate

21-26 May 2006

Firstpage

1

Lastpage

2

Abstract

Optical-pump, terahertz-probe reflection spectroscopy was investigated for the study of femtosecond laser-induced ablation dynamics. The technique can directly measure the quasi-DC complex electrical conductivities of laser-heated solids using non-contact terahertz probe pulses.

Keywords

electrical conductivity measurement; high-speed optical techniques; laser ablation; phase transformations; submillimetre wave spectroscopy; time resolved spectroscopy; electrical conductivity measurements; femtosecond laser-induced ablation dynamics; laser heated solids; noncontact terahertz probe pulse; optical-pump reflection spectroscopy; quasiDC complex electrical conductivity; terahertz time-resolved reflection spectroscopy; Conductivity measurement; Electric variables measurement; Laser ablation; Optical reflection; Probes; Pulse measurements; Solid lasers; Spectroscopy; Submillimeter wave measurements; Ultrafast optics; (300.6530) Spectroscopy, ultrafast; (350.5400) Plasmas;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on

Conference_Location

Long Beach, CA

Print_ISBN

978-1-55752-813-1

Electronic_ISBN

978-1-55752-813-1

Type

conf

DOI

10.1109/CLEO.2006.4628604

Filename

4628604