Title :
Test Application Timing: The Unexplored Issue in AC Test
Author :
Iyengar, V.S. ; Vijayan, G.
Keywords :
AC generators; Circuit faults; Circuit simulation; Circuit testing; Delay; Heuristic algorithms; Integrated circuit testing; Manufacturing; Test equipment; Timing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519749
