• DocumentCode
    2877278
  • Title

    Test Application Timing: The Unexplored Issue in AC Test

  • Author

    Iyengar, V.S. ; Vijayan, G.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    840
  • Keywords
    AC generators; Circuit faults; Circuit simulation; Circuit testing; Delay; Heuristic algorithms; Integrated circuit testing; Manufacturing; Test equipment; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519749
  • Filename
    519749
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2877278