Title :
HARDWARE ACCELERATION ALONE WILL NOT MAKE FAULT GRADING ULSI A REALITY
Author :
Ganapathy, Gopi ; Abraham, Jacob A.
Keywords :
Acceleration; Circuit faults; Circuit simulation; Circuit testing; Costs; Fault detection; Hardware; Microprocessors; Switches; Ultra large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519750