مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2877295

Title :

Looking for Functional Fault Equivalence

Author :

Lioy, A.

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

858

Keywords :

Automatic testing; Boolean functions; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Fault diagnosis; Sequential analysis; Target recognition;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519751

Filename :

519751

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2877295