• DocumentCode
    2877337
  • Title

    IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS

  • Author

    Bruce, W.C. ; Gallup, Michael G. ; Giles, Grady ; Munns, Tom

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    879
  • Keywords
    CMOS technology; Design for testability; Microprocessors; Pins; Production facilities; Reduced instruction set computing; Semiconductor devices; Statistics; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519754
  • Filename
    519754