• DocumentCode
    2877348
  • Title

    A 34ns 256Kb DRAM

  • Author

    Natori, K. ; Furuyama, Toshiya ; Saito, Sakuyoshi ; Fujii, Shohei ; Toda, Hiroaki ; Tanaka, T. ; Ozawa, O.

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • Volume
    XXVI
  • fYear
    1983
  • fDate
    23-25 Feb. 1983
  • Firstpage
    232
  • Lastpage
    233
  • Abstract
    A 256K × 1b MOS DRAM, using power circuits and MoSi2gate transistors, will be reported. Division of the chip into eight blocks results in 34ns \\overline {CAC} access time, 94ns \\overline {RAC} and 170mW active power.
  • Keywords
    Capacitors; Content addressable storage; Decoding; Electronics packaging; Emergency power supplies; MOSFETs; Random access memory; Testing; Timing; Variable structure systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1983.1156521
  • Filename
    1156521