DocumentCode
2877348
Title
A 34ns 256Kb DRAM
Author
Natori, K. ; Furuyama, Toshiya ; Saito, Sakuyoshi ; Fujii, Shohei ; Toda, Hiroaki ; Tanaka, T. ; Ozawa, O.
Author_Institution
Toshiba Corp., Kawasaki, Japan
Volume
XXVI
fYear
1983
fDate
23-25 Feb. 1983
Firstpage
232
Lastpage
233
Abstract
A 256K × 1b MOS DRAM, using power circuits and MoSi2 gate transistors, will be reported. Division of the chip into eight blocks results in 34ns
access time, 94ns
and 170mW active power.
access time, 94ns
and 170mW active power.Keywords
Capacitors; Content addressable storage; Decoding; Electronics packaging; Emergency power supplies; MOSFETs; Random access memory; Testing; Timing; Variable structure systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1983.1156521
Filename
1156521
Link To Document