Title :
Gate-Delay-Fault Testability Properties of Multiplexor-Based Networks
Author :
Ashar, Pranav ; Devadas, Srinivas ; Keutzer, Kurt
Keywords :
Binary decision diagrams; Boolean functions; Circuit faults; Circuit synthesis; Circuit testing; Data structures; Logic testing; Network synthesis; Redundancy; Robustness;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519755
