Title :
Logic Partitioning and Resynthesis for Testability
Author :
De, Kaushik ; Banerjee, Prithu
Keywords :
Circuit testing; Costs; Logic testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519757
