DocumentCode

2877403

Title

Logic Partitioning and Resynthesis for Testability

Author

De, Kaushik ; Banerjee, Prithu

fYear

1991

fDate

26-30 Oct 1991

Firstpage

906

Keywords

Circuit testing; Costs; Logic testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1991, Proceedings., International

ISSN

1089-3539

Print_ISBN

0-8186-9156-5

Type

conf

DOI

10.1109/TEST.1991.519757

Filename

519757