DocumentCode
2877449
Title
Performance Modeling for Carbon Nanotube Interconnects in On-Chip Power Distribution
Author
Naeemi, Azad ; Huang, Gang ; Meindl, James D.
Author_Institution
Georgia Inst. of Technol., Atlanta
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
420
Lastpage
428
Abstract
A novel paradigm is proposed to potentially use thin single-wall carbon nanotube (SWNT) signal interconnects and large-diameter multi-wall carbon nanotube (MWNT) power interconnects in the second interconnect level. Using physical circuit models for SWNTs and MWNTs, it is demonstrated that by the end of the ITRS the proposed approach can improve the sheet resistance of power interconnects by up to 3 times, improve the speed of local signal interconnects by 50%, and lower their dynamic power dissipation by more than two times. In the first interconnect level, a hybrid system of power copper wires and thin SWNT signal interconnects would offer the same improvements for signal interconnects and allow utilizing thick copper wires with no performance or power penalties for signal interconnects. At the global levels, it is shown a minimum density of 1 metallic SWNT per 2.5 nm2 cross-sectional area is needed to outperform copper power interconnects. Power grids made out of MWNTs can offer smaller resistances compared to copper grids only if very coarse grids with grid pitches larger than 20 mum are needed.
Keywords
carbon nanotubes; integrated circuit interconnections; integrated circuit modelling; nanoelectronics; C; carbon nanotube interconnects; copper grids; on-chip power distribution; performance modeling; physical circuit models; power interconnects; sheet resistance; signal interconnects; single-wall carbon nanotube; Carbon nanotubes; Copper; Delay; Electromigration; Integrated circuit interconnections; Power dissipation; Power distribution; Power grids; Power system interconnection; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373831
Filename
4249917
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