DocumentCode
2877481
Title
AN EFFICIENT, FORWARD FAULT SIMULATION ALGORITHM BASED ON THE PARALLEL PATTERN SINGLE FAULT PROPAGAT
Author
Lee, Hyung Ki ; Ha, Dong Sam
fYear
1991
fDate
26-30 Oct 1991
Firstpage
946
Keywords
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Design for testability; Pattern analysis; Sequential circuits; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519760
Filename
519760
Link To Document