Title :
AN EFFICIENT, FORWARD FAULT SIMULATION ALGORITHM BASED ON THE PARALLEL PATTERN SINGLE FAULT PROPAGAT
Author :
Lee, Hyung Ki ; Ha, Dong Sam
Keywords :
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Design for testability; Pattern analysis; Sequential circuits; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519760
