DocumentCode
2877496
Title
MULTIPLE-FAULT SIMULATION AND COVERAGE OF DETERMINISTIC SINGLE-FAULT TEST SETS
Author
Kubiak, Ken ; Fuchs, W. Kent
fYear
1991
fDate
26-30 Oct 1991
Firstpage
956
Keywords
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Electrical fault detection; Fault detection; Performance evaluation; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519761
Filename
519761
Link To Document