DocumentCode
2877505
Title
TWO-STAGE FAULT LOCATION
Author
Ryan, Paul G. ; Rawat, Shishpal ; Fuchs, W. Kent
fYear
1991
fDate
26-30 Oct 1991
Firstpage
963
Keywords
Circuit faults; Circuit testing; Cities and towns; Computational efficiency; Dictionaries; Fault detection; Fault diagnosis; Fault location; Microcomputers; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519762
Filename
519762
Link To Document