Title :
TWO-STAGE FAULT LOCATION
Author :
Ryan, Paul G. ; Rawat, Shishpal ; Fuchs, W. Kent
Keywords :
Circuit faults; Circuit testing; Cities and towns; Computational efficiency; Dictionaries; Fault detection; Fault diagnosis; Fault location; Microcomputers; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519762
