DocumentCode
2877633
Title
Parity Bit Calculation and Test Signal Compaction for BTST Applications
Author
Park, Sungju ; Akers, Sheldon B.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
1016
Keywords
Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Explosions; Performance analysis; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519769
Filename
519769
Link To Document