Title :
Parity Bit Calculation and Test Signal Compaction for BTST Applications
Author :
Park, Sungju ; Akers, Sheldon B.
Keywords :
Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Explosions; Performance analysis; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519769
