A 20 BIT WAVEFORM SOURCE FOR A MIXED-SIGNAL AUTOMATIC TEST SYSTEM
Author :
Rosenthal, Daniel
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
1049
Keywords :
Automatic testing; Calibration; Error correction; Gain control; Instruments; Linearity; Noise shaping; Random access memory; Signal resolution; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
