DocumentCode

2877763

Title

HIGH FREQUENCY WAFER PROBING AND POWER SUPPLY RESONANCE EFFECTS

Author

Athan, S.P. ; Keezer, D.C. ; McKinley, J.

fYear

1991

fDate

26-30 Oct 1991

Firstpage

1069

Keywords

Blades; Capacitors; Ceramics; Frequency; Power supplies; Predictive models; Probes; Resonance; Semiconductor device modeling; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1991, Proceedings., International

ISSN

1089-3539

Print_ISBN

0-8186-9156-5

Type

conf

DOI

10.1109/TEST.1991.519776

Filename

519776