Title :
A 1Mb ROM with on chip ECC for yield enhancement
Author :
Shinoda, Takashi ; Ohnishi, Yoshihiro ; Kawamoto, Hiroaki ; Takizawa, Kenichi ; Narita, Kazuyo
Author_Institution :
Hitachi Development Center, Tokyo, Japan
Keywords :
CMOS memory circuits; CMOS technology; Clocks; Decoding; Driver circuits; Electronics packaging; Error correction; Error correction codes; Read only memory; Sensor arrays;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1983.1156544