DocumentCode
2877842
Title
Robust texture classification by subsets of local binary patterns
Author
Topi, Mäenpää ; Timo, Ojala ; Matti, Pietikäinen ; Maricor, Sariano
Author_Institution
Dept. of Electr. Eng., Oulu Univ., Finland
Volume
3
fYear
2000
fDate
2000
Firstpage
935
Abstract
Recently, a nonparametric approach to texture analysis has been developed, in which the distributions of simple texture measures based on local binary patterns (LBP) are used for texture description. The basic LBP encodes 256 simple feature detectors in a single 3×3 operator. This paper shows that a properly selected subset of patterns encoded in LBP forms an efficient and robust texture description which can achieve better classification rates in comparison with the whole LBP histogram. Experiments on classification of textures from the Columbia-Utrecht (CURET) database demonstrate the robustness of the approach
Keywords
feature extraction; image classification; image texture; Columbia-Utrecht database; feature extraction; histogram; image texture; local binary patterns; texture classification; Cameras; Computer vision; Detectors; Electric variables measurement; Histograms; Machine vision; Pattern analysis; Robustness; Surface texture; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.903698
Filename
903698
Link To Document